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Microscopy Laboratories

  • Microscopy and Spectroscopy Laboratory
    The microscopy and spectroscopy facilities include various optical microscopes, electron microscopes, scanning probe microscopes and Energy dispersive spectroscopy and X-ray photoelectron spectroscopy. These facilities extensively serve for education and research in materials science, biomedical engineering and nanotechnology.
  • Multifunctional scanning probe microscope
    This instrument is located in Nanoscale Imaging & Characterization Laboratory. The multifunctional scanning probe microscope (Molecular imaging, PicoSPM ® II) possesses the following capabilities: contact and non-contact mode AFM, force measurement and force array imaging, acoustic AC model electrostatic force microscopy (EFM), scanning Kelvin Probe microscopy, magnetic force microscopy, scanning tunneling microscopy , current sensing AFM (Conductive AFM), Electrochemical AFM and AFM-based nanolithography. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. This SPM can be extensively applied to measurement of materials, devices and biological molecules.
  • Leitz Optical Microscope
    The Leitz optical microscope used here is coupled with a CCD camera and an image grabber run from a PC. These micrographs are then viewed and evaluated using various image analysis software. Such data as grain size, precipitate volume fraction, and precipitate morphology are obtained from the pictures taken.
  • 3-D Hi-Scope Microscope
    The 3-D Hi-scope enables 360-degree dynamic rotation with oblique viewing. Tilted lightening and zoom lens make it versatile for both macro and micro examination. All digital imaging system is easy for operation and image processing. Software is equipped for dimension measurement.
  • Accu-scope Phase contrast optical microscope
    The Accu-scope 3016 microscope, which is equipped with a CCD camera and the imaging analysis software, offers exceptional value, versatility and performance to meet the requirements of materials science and biology. It is capable of imaging under multiple modes such as phase contrast, polarization, bright field and dark field.
  • Hitachi S-4000 scanning electron microscope
    HITACHI S-4000 SEM is a conventional electron microscope that is used for daily sample examination and periodic class. Its features include 20x-300kx magnification, 0.5 to 30kV accelerating voltage, four position click-stop heated aperture, 25mm x 25mm stage with -5 to 45 degree tilt, 12-inch built in TV monitor x2, digital frame store, Polaroid camera and 4x5 film back.
  • Hitachi S-4700 field emission scanning electron microscope
    The S-4700 FE-SEM is a shared facility located in the Department of Chemical and Biomedical Engineering. It combines the versatility of PC control with a novel electron optical column to give exceptional performance on large and small specimens. High resolution at 15kV is guaranteed at the EDX and specimen exchange position of 12mm working distance.
  • JOEL-100CX transmission electron microscopy
    JOEL-100CX is a shared facility located in Department of Chemical and Biomedical Engineering. It is capable of accelerating voltages from 20-100kv. It can provide magnification from 100x to 600000x and a resolution of 0.2nm. It is primarily used in analysis of solid materials.

  • X-ray photoelectron spectroscopy
    The new XPS instrument is a shared facility that serves the users cross the campus and outside campus. It has the following capabilities:
    • Identification of the elements and the chemical status of elements
    • Quantification of chemical composition
    • Destructive depth profiling using an ion gun (with Zalar rotation)
    • Non-destructive depth profiling by the angle-resolved analysis
    • Neutralization of surface charging with the flood guns
    • Capable of performing ultraviolet photoelectron spectroscopy
    • XPS imaging
    • Automated acquisition of XPS spectra
    • Automated depth profiling
    • Automatic peak fitting, elemental identification, depth profile calculation, as well as curve smoothing, and background removal with the loaded software